SCOPUS 정보 검색 플랫폼

Applied Surface Science

Volumn 182, Issue 1-2, 2001, Pages 64-68

Nanometer-scale recording with transition time at nanosecond

(4) Shi, D X a,b Ba, D C a Pang, S J a,b Gao, H J a

a NORTHEASTERN UNIVERSITY (China)

b INSTITUTE OF PHYSICS (China)

Author keywords

Data storage; Recording; Scanning tunneling microscopy; Transient conductance

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTANCE; GRAPHITE; OPTICAL DATA STORAGE; OPTICAL RECORDING; PROBES; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; SURFACE TREATMENT;

HIGHLY ORDERED PYROLYTIC GRAPHITE (HOPG);

THIN FILMS;

EID: 0035813572 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(01)00454-8 Document Type: Article

Times cited : (6)

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