S-parameter broadband measurements of microstrip lines and extraction of the substrate intrinsic properties

Microwave and Optical Technology Letters

Volumn 30, Issue 1, 2001, Pages 65-69

  Hinojosa, J ^a   Faucon, L ^b   Queffelec, P ^c   Huret, F ^c  

^a TECHNICAL UNIVERSITY OF CARTAGENA   (Spain)

^b INSTITUT D ELECTRONIQUE   (France)

^c UNIVERSITÉ DE BRETAGNE OCCIDENTALE   (France)

Author keywords

Microstrip transmission line; Permittivity and permeability broadband measurement; S parameters

Indexed keywords

DIELECTRIC MATERIALS; ELECTROMAGNETIC WAVE PROPAGATION; MAGNETIC PERMEABILITY MEASUREMENT; MATHEMATICAL MODELS; PERMITTIVITY MEASUREMENT; SCATTERING PARAMETERS; SUBSTRATES;

ISOTROPIC FILM; MICROSTRIP LINE SUBSTRATE; MICROSTRIP TRANSMISSION LINE;

MICROSTRIP LINES;

EID: 0035811938     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/mop.1222     Document Type: Article

References (14)

1. Automatic measurement of complex dielectric constant and permeability at microwave frequencies
2. A microstrip device for the broad-band simultaneous measurement of complex permeability and permittivity
3. Two simple methods for the measurement of dielectric permittivity of low-loss microstrip substrates
4. Two methods for the measurement of substrate dielectric constant
5. Permittivity characterization from transmission line measurement
6. Quasicomplex modes on lossy substrate boxed microstrip lines
7. Algorithms for computer-aided design of linear microwave circuits
8. A new method for determining the FET small signal equivalent circuit
9. Noniterative stable transmission-reflection method for low-loss material complex permittivity determination
10. Contribution à la caractérisation électromagnétique de matériaux à partir de lignes plaquées-Applications à l'étude nouveaux matériaux
11. Losses of microstrip lines
12. Spurious radiation from microstrip
13. Microstrip propagation on magnetic substrates-part I and part II