Modelling studies of amorphous In-Se films

Journal of Alloys and Compounds

Volumn 328, Issue 1-2, 2001, Pages 214-217

  Jablonska A ^a   Burian, A ^a,b   Burian, A M ^b   Lecante, P ^c   Mosset, A ^d  

^a UNIVERSITY OF SILESIA   (Poland)

^b CENTRE OF POLYMER AND CARBON MATERIALS   (Poland)

^c CEMES CNRS   (France)

^d LABORATOIRE DE CRISTALLOGRAPHIE   (France)

Author keywords

Amorphous materials; Vapour deposition; X ray diffraction

Indexed keywords

CHEMICAL BONDS; CORRELATION METHODS; CRYSTALLINE MATERIALS; LIGHT AMPLIFIERS; LIGHT SCATTERING; PHYSICAL VAPOR DEPOSITION; SEMICONDUCTING INDIUM COMPOUNDS; VAN DER WAALS FORCES; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

INTERLAYER INTERACTIONS;

AMORPHOUS FILMS;

EID: 0035807507     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(01)01321-4     Document Type: Article

References (11)