Characterisation of thin films containing Au and Pd nanoparticles by grazing-incidence X-ray diffraction and related methods

Journal of Alloys and Compounds

Volumn 328, Issue 1-2, 2001, Pages 248-252

  Pelka, J B ^a   Paszkowicz, W ^a   Dluzewski, P ^a   Brust, M ^a   Kiely, C J ^a   Knapp, M ^a   Czerwosz, E ^a  

^a INSTITUTE OF PHYSICS   (Poland)

Author keywords

Au; Nanoparticles; Pd; Thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL MICROSTRUCTURE; GLASS; GOLD; NANOSTRUCTURED MATERIALS; PALLADIUM; RAMAN SCATTERING; SCANNING TUNNELING MICROSCOPY; SILICON WAFERS; SIZE DETERMINATION; SUBSTRATES; SYNCHROTRON RADIATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY POWDER DIFFRACTION;

CARBONACEOUS LAYERS;

THIN FILMS;

EID: 0035807505     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-8388(01)01303-2     Document Type: Article

References (8)