"Inverted hut" structure of Si-Ge nanocrystals studied by extended x-ray absorption fine structure method

Applied Physics Letters

Volumn 78, Issue 23, 2001, Pages 3684-3686

  Soo, Y L ^a   Kioseoglou, G ^a   Huang, S ^a   Kim, S ^a   Kao, Y H ^a   Peng, Y H ^b   Cheng, H H ^b  

^a UNIVERSITY AT BUFFALO   (United States)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035806205     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1377311     Document Type: Article

References (21)

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