SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Applied Physics Letters

Volumn 79, Issue 23, 2001, Pages 3815-3817

Investigation of oxidation mechanism for ohmic formation in Ni/Au contacts to p-type GaN layers

(3) Lee, Chi Sen a Lin, Yow Jon b Lee, Ching Ting b

a NATIONAL TAIWAN OCEAN UNIVERSITY (Taiwan)

b NATIONAL CENTRAL UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035803206 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1425065 Document Type: Article

Times cited : (53)

References (13)

1
- 0031245474
- Y. F. Wu, B. P. Keller, S. Keller, D. Kapolnek, P. Kozodoy, S. P. Denbaars, and U. K. Mishra, Solid-State Electron. 41, 1569 (1997).
- (1997) Solid-state Electron. , vol.41 , pp. 1569
- Wu, Y.F.¹ Keller, B.P.² Keller, S.³ Kapolnek, D.⁴ Kozodoy, P.⁵ Denbaars, S.P.⁶ Mishra, U.K.⁷

2
- 0042229788
- S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Matsushita, and T. Mukai, Appl. Phys. Lett. 76, 22 (2000).
- (2000) Appl. Phys. Lett. , vol.76 , pp. 22
- Nakamura, S.¹ Senoh, M.² Nagahama, S.³ Iwasa, N.⁴ Matsushita, T.⁵ Mukai, T.⁶

3
- 0346282583
- H. Ishikawa, S. Kobayashi, Y. Koide, S. Yamasaki, S. Nagai, J. Umezaki, M. Koike, and M. Murakami, J. Appl. Phys. 81, 1315 (1997).
- (1997) J. Appl. Phys. , vol.81 , pp. 1315
- Ishikawa, H.¹ Kobayashi, S.² Koide, Y.³ Yamasaki, S.⁴ Nagai, S.⁵ Umezaki, J.⁶ Koike, M.⁷ Murakami, M.⁸

4
- 0035440462
- Y. J. Lin and C. T. Lee, J. Vac. Sci. Technol. B 19, 1734 (2001).
- (2001) J. Vac. Sci. Technol. B , vol.19 , pp. 1734
- Lin, Y.J.¹ Lee, C.T.²

5
- 0001204411
- J. Sun, K. A. Rickert, J. M. Redwing, A. B. Ellis, F. J. Himpsel, and T. F. Kuech, Appl. Phys. Lett. 76, 415 (2000).
- (2000) Appl. Phys. Lett. , vol.76 , pp. 415
- Sun, J.¹ Rickert, K.A.² Redwing, J.M.³ Ellis, A.B.⁴ Himpsel, F.J.⁵ Kuech, T.F.⁶

6
- 0035274131
- J. K. Kim, K. J. Kim, B. Kim, J. N. Kim, J. S. Kwak, Y. J. Park, and J. L. Lee, J. Electron. Mater. 30, 129 (2001).
- (2001) J. Electron. Mater. , vol.30 , pp. 129
- Kim, J.K.¹ Kim, K.J.² Kim, B.³ Kim, J.N.⁴ Kwak, J.S.⁵ Park, Y.J.⁶ Lee, J.L.⁷

7
- 0000040230
- Y. J. Lin, C. D. Tsai, Y. T. Lyu, and C. T. Lee, Appl. Phys. Lett. 77, 687 (2000).
- (2000) Appl. Phys. Lett. , vol.77 , pp. 687
- Lin, Y.J.¹ Tsai, C.D.² Lyu, Y.T.³ Lee, C.T.⁴

8
- 0000153566
- Y. J. Lin and C. T. Lee, Appl. Phys. Lett. 77, 3986 (2000).
- (2000) Appl. Phys. Lett. , vol.77 , pp. 3986
- Lin, Y.J.¹ Lee, C.T.²

9
- 22644449418
- J. K. Kim, J. L. Lee, J. W. Lee, Y. J. Park, and T. Kim, J. Vac. Sci. Technol. B 17, 497 (1999).
- (1999) J. Vac. Sci. Technol. B , vol.17 , pp. 497
- Kim, J.K.¹ Lee, J.L.² Lee, J.W.³ Park, Y.J.⁴ Kim, T.⁵

10
- 3242825916
- L. C. Chen, F. R. Chen, J. J. Kai, L. Chang, J. K. Ho, C. S. Jong, C. C. Chiu, C. N. Huang, C. Y. Chen, and K. K. Shih, J. Appl. Phys. 86, 3826 (1999).
- (1999) J. Appl. Phys. , vol.86 , pp. 3826
- Chen, L.C.¹ Chen, F.R.² Kai, J.J.³ Chang, L.⁴ Ho, J.K.⁵ Jong, C.S.⁶ Chiu, C.C.⁷ Huang, C.N.⁸ Chen, C.Y.⁹ Shih, K.K.¹⁰

11
- 0001585242
- D. Qiao, L. S. Yu, S. S. Lau, J. Y. Lin, H. X. Jiang, and T. E. Haynes, J. Appl. Phys. 88, 4196 (2000).
- (2000) J. Appl. Phys. , vol.88 , pp. 4196
- Qiao, D.¹ Yu, L.S.² Lau, S.S.³ Lin, J.Y.⁴ Jiang, H.X.⁵ Haynes, T.E.⁶

12
- 0004071496
- Wiley, New York
- D. K. Schroder, Semiconductor Material and Device Characterization, 2nd ed. (Wiley, New York, 1990).
- (1990) Semiconductor Material and Device Characterization, 2nd Ed.
- Schroder, D.K.¹

13
- 0000928891
- D. C. Look, D. C. Reynolds, U. W. Hemsky, J. R. Sizelove, R. L. Jones, and R. J. Molnar, Phys. Rev. Lett. 79, 2273 (1997).
- (1997) Phys. Rev. Lett. , vol.79 , pp. 2273
- Look, D.C.¹ Reynolds, D.C.² Hemsky, U.W.³ Sizelove, J.R.⁴ Jones, R.L.⁵ Molnar, R.J.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.