SCOPUS 정보 검색 플랫폼

Volumn 45, Issue 11, 2001, Pages 1287-1294

Selection of crack-tip slip systems in the thermal arrest of cleavage cracks in dislocation-free silicon single crystals

(2) Argon, A S a Gally, B J a

a Massachusetts Institute of Technology Cambridge (United States)

Author keywords

Dislocation emission; Fracture transitions; Silicon

Indexed keywords

BRITTLE FRACTURE; CRACK PROPAGATION; DEFECTS; DISLOCATIONS (CRYSTALS); ETCHING; FRACTURE MECHANICS; NUCLEATION; PITTING; SINGLE CRYSTALS; STRESS RELAXATION; THERMAL GRADIENTS;

CLEAVAGE CRACKS; CRACK TIP SLIP SYSTEMS; FRACTURE TRANSITIONS;

SEMICONDUCTING SILICON;

EID: 0035802566 PISSN: 13596462 EISSN: None Source Type: Journal
DOI: 10.1016/S1359-6462(01)01163-0 Document Type: Article

Times cited : (14)

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