Four-path interference and uncertainty principle in photodetachment microscopy

Europhysics Letters

Volumn 56, Issue 4, 2001, Pages 471-477

  Kramer, T ^a   Bracher, C ^a   Kleber, M ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035798520     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i2001-00543-x     Document Type: Article

References (20)

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