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Volumn 63, Issue 1-2, 2001, Pages 119-126

Influence of depth resolution on the interdiffusion data in thin film bilayer and multilayer Ag/Pd structures

(1) Bukaluk, A a

a UNIVERSITY OF TECHNOLOGY AND LIFE SCIENCES (Poland)

Author keywords

Auger eletron spectroscopy; Depth profiles; Depth resolution; Interdiffusion

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COPPER; DEPOSITION; GOLD; METALLIC FILMS; MULTILAYERS; PALLADIUM; SILICA; SUBSTRATES; THIN FILMS;

DEPTH PROFILING;

INTERDIFFUSION (SOLIDS);

EID: 0035797026 PISSN: 0042207X EISSN: None Source Type: Journal
DOI: 10.1016/S0042-207X(01)00179-8 Document Type: Conference Paper

Times cited : (7)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.