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Volumn 63, Issue 1-2, 2001, Pages 233-239

Characterisation of Cd1-xMgxSe solid solutions by spectroscopic ellipsometry

Author keywords

Dielectric function; II VI semiconductors; Photoluminescence; Spectroscopic ellipsometry

Indexed keywords

COMPOSITION EFFECTS; ELECTRON TRANSITIONS; ELLIPSOMETRY; ENERGY GAP; EXCITONS; MELTING; PHOTONS; REFRACTIVE INDEX; SEMICONDUCTOR GROWTH; SOLID SOLUTIONS; SPECTROSCOPIC ANALYSIS;

EID: 0035797009     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(01)00197-X     Document Type: Conference Paper
Times cited : (11)

References (24)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.