Composition-dependent electrical resistivity in an Al-Re-Si 1/1-cubic approximant phase: An indication of electron confinement in clusters

Physical Review Letters

Volumn 86, Issue 14, 2001, Pages 3104-3107

  Tamura, R ^a   Asao, T ^a   Takeuchi, S ^a  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHARGE TRANSFER; COMPOSITION EFFECTS; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRON DIFFRACTION; QUASICRYSTALS; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON CONFINEMENT; VIRTUAL BOUND STATES;

ALUMINUM ALLOYS;

EID: 0035794691     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.3104     Document Type: Article

References (15)