Coarsening of Lamellar Microstructures in Directionally Solidified Yttrium Aluminate/Alumina Eutectic Fiber

Journal of the American Ceramic Society

Volumn 84, Issue 3-12, 2001, Pages 2991-2996

  Park, Deok Yong ^a   Yang, Jenn Ming ^a   Collins, Joseph M ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Saphikon Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; HEAT TREATMENT; INTERFACES (MATERIALS); SCANNING ELECTRON MICROSCOPY; TEMPERATURE; THERMODYNAMIC STABILITY; X RAY DIFFRACTION ANALYSIS; YTTRIUM COMPOUNDS;

ALUMINA EUTECTIC FIBER; COARSENING; EDGE DEFINED FILM FED GROWTH; LAMELLAR MICROSTRUCTURE; YTTRIUM ALUMINATE;

EUTECTICS;

EID: 0035790534     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2001.tb01126.x     Document Type: Article

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