Consequence of Nanometer-Scale Property Variations to Macroscopic Properties of CrOCN Thin Films

Journal of the American Ceramic Society

Volumn 84, Issue 3-12, 2001, Pages 2873-2881

  Smith, Jackson ^a   French, Roger H ^b   Duscher, Gerd ^c   Bonnell, Dawn ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b DUPONT COMPANY   (United States)

^c North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM; CHROMIUM COMPOUNDS; COMPOSITION; LIGHT ABSORPTION; NEGATIVE IONS; SPECTROSCOPY; STATISTICAL METHODS; TRANSMISSION ELECTRON MICROSCOPY;

BINARY COMPOUNDS; MACROSCOPIC PROPERTIES; NEAR-EDGE STRUCTURE; SPUTTERED NEUTRAL MASS SPECTROSCOPY; TERNARY COMPOUNDS; X-RAY PHOTOEMISSION SPECTROSCOPY;

THIN FILMS;

EID: 0035790349     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2001.tb01108.x     Document Type: Article

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