|
Volumn , Issue , 2001, Pages 5-6
|
The feasibility of atomic force microscopy as a cytodetachment technique to quantify osteoblastic adhesion with implant surfaces
a a,b c b b d
d
NONE
(United States)
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ADHESION;
ATOMIC FORCE MICROSCOPY;
BONE;
OPTIMIZATION;
SURFACES;
CYTODETACHMENT TECHNIQUE;
IMPLANT SURFACES;
OSTEOBLASTIC ADHESION;
IMPLANTS (SURGICAL);
|
EID: 0035784230
PISSN: 1071121X
EISSN: 21607001
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
|
References (4)
|