Evaluating high performance diffusion barriers: The calcium test

SID Conference Record of the International Display Research Conference

Volumn , Issue , 2001, Pages 1435-1438

  Nisato, G ^a   Bouten, P C P ^a   Slikkerveer, P J ^a   Bennett, W D ^b   Graff, G L ^b   Rutherford, N ^c   Wiese, L ^d  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^c Vitex Systems   (United States)

^d NextGen Technologies   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM; CRYSTAL DEFECTS; LIGHT EMITTING DIODES; PLASTIC ADHESIVES; SUBSTRATES;

DIFFUSION BARRIERS;

DIFFUSION;

EID: 0035782822     PISSN: 10831312     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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