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Springer Series in Chemical Physics

Volumn 66, Issue , 2001, Pages 349-353

Resonant rayleigh scattering from semiconductor nanostructures: Ultrafast spectral interferometry

(3) Birkedal, Dan a,b Shchegrov, Andrei c,d Shah, Jagdeep a

a LUCENT TECHNOLOGIES (United States)

b TECHNICAL UNIVERSITY OF DENMARK (Denmark)

c UNIVERSITY OF ROCHESTER (United States)

d KLA TENCOR CORPORATION (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL STRUCTURE; CONFERENCE PAPER; DYNAMICS; INTERFEROMETRY; LASER; LUMINESCENCE; PHYSICS; SEMICONDUCTOR; SPECTRAL SENSITIVITY; SPECTROSCOPY;

EID: 0035779490 PISSN: 01726218 EISSN: None Source Type: Journal
DOI: 10.1007/978-3-642-56546-5_101 Document Type: Article

Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.