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Volumn 46, Issue 2, 2001, Pages 241-248
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Determining permittivity and permeability from the reflection coefficient of optically thin samples
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTROMAGNETIC WAVE REFLECTION;
MAGNETIC PERMEABILITY;
MICROWAVES;
PERMITTIVITY;
STANDING WAVE METERS;
OPTICALLY THIN SPECIMENS;
PERMITTIVITY MEASUREMENT;
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EID: 0035770709
PISSN: 00338494
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (1)
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References (0)
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