Isotopic analysis of 28Si-enriched silicon using laser mass spectrometry

Zhurnal Analiticheskoj Khimii

Volumn 56, Issue 5, 2001, Pages 496-503

  Kovalev, I D ^a   Malyshev, K N ^a   Potapov, A M ^a   Suchkov, A I ^a  

^a NONE

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EID: 0035768792     PISSN: 00444502     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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