Automated, transformation invariant, shape recognition through wavelet multiresolution

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4478, Issue , 2001, Pages 434-444

  Brault, Patrice ^a   Mounier, Hugues ^a  

^a UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

Contour matching with curvature criterion; Dynamic programming; Recognition decision parameter; Shape Recognition; Transformation invariance; Wavelet Multi Resolution

Indexed keywords

DATABASE SYSTEMS; DYNAMIC PROGRAMMING; IMAGE ANALYSIS; OPTICAL SENSORS;

SHAPE RECOGNITION; WAVELET MULTIRESOLUTION;

PATTERN RECOGNITION;

EID: 0035767559     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.449735     Document Type: Conference Paper

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