Measurements of the integrated reflectivity of a mica crystal for different orders of reflection

Proceedings of SPIE-The International Society for Optical Engineering

Volumn 4501, Issue , 2001, Pages 177-184

  Lee, S G ^a   Bak, J G ^a   Jung, Y S ^a   Bitter, M ^b   Hill, K W ^b   Wehrhan, O ^c   Foerster, E ^c  

^a Korea Basic Science Institute (KBSI)   (South Korea)

^b PRINCETON PLASMA PHYSICS LABORATORY   (United States)

^c FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

Bragg angle; Integrated reflectivity; Mica crystal; X ray crystal spectrometer

Indexed keywords

CALIBRATION; DIFFRACTION GRATINGS; ERRORS; LIGHT MEASUREMENT; LIGHT REFLECTION; OPTICAL MATERIALS; SINGLE CRYSTALS; STATISTICAL METHODS; X RAY SPECTROMETERS;

BRAGG ANGLE; INTEGRATED REFLECTIVITY; MICA CRYSTAL; STATISTICAL ERRORS; X RAY CRYSTAL SPECTROMETER;

MICA;

EID: 0035766675     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.448492     Document Type: Article

References (4)

1. G. Hölzer, O. Wehrhan, J. Heinish, E. Förster, T.A. Pikuz, Ya. Faenov, S.A. Pikuz, V.M. Romanova, and T.A. Shelovenko, "Flat and spherically bent muscovite (mica) crystals for x-ray spectroscopy", Physica Scripta 57, pp. 301-309, 1998.
2. S.G. Lee, S.M. Hwang, and M. Bitter, "X-ray crystal spectrometer for the HANBIT mirror machine", Rev. Sci. Instrum. 70, pp. 299-301, 1999.
3. S.G. Lee et al., to be submitted to Physica Scripta.