High resolution X-ray fluorescence micro-tomography on single sediment particles

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4503, Issue , 2001, Pages 240-248

  Vincze, L ^a   Vekemans, B ^a   Szaloki I ^b   Janssens, K ^a   Van Grieken, R ^a   Feng, H ^c   Jones, K W ^c   Adams, F ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

^b UNIVERSITY OF DEBRECEN   (Hungary)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; GRAIN SIZE AND SHAPE; INORGANIC COMPOUNDS; ORGANIC COATINGS; SEDIMENTS; X RAY ANALYSIS;

X-RAY FLUORESCENCE ELEMENT MICROTOMOGRAPHY (XFEMT);

COMPUTERIZED TOMOGRAPHY;

EID: 0035764546     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.452865     Document Type: Article

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