Forensic applications of ion beam mixing and surface spectroscopy of latent fingerprints

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4468, Issue , 2001, Pages 65-77

  Koch, C H ^a   Augustine, Matthew R ^a   Marcus, H L ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

Auger mapping of fingerprints; Chemical imaging of fingerprints; Fingerprint analysis; Fingerprints; Forensic; Ion beam mixing fingerprints; Ion implantation; SIMS

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COMPOSITION; COMPUTER AIDED ANALYSIS; IMAGE ANALYSIS; ION BEAMS; ION IMPLANTATION; SECONDARY ION MASS SPECTROMETRY; X RAY ANALYSIS;

ION BEAM MIXING;

IMAGING SYSTEMS;

EID: 0035763115     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.452561     Document Type: Article

References (0)