Phase retrieval in electronic speckle pattern interferometry using the continuous wavelet transform

Proceedings of SPIE-The International Society for Optical Engineering

Volumn 4419, Issue , 2001, Pages 162-165

  Federico, A ^a   Kaufmann, G H ^b  

^a INSTITUTO NACIONAL DE TECNOLOGÍA INDUSTRIAL   (Argentina)

^b UNIVERSIDAD NACIONAL DE ROSARIO   (Argentina)

Author keywords

Interferometry; Optical metrology; Speckle

Indexed keywords

APPROXIMATION THEORY; COMPUTER SIMULATION; INTERFEROMETRY; SPECKLE; WAVELET TRANSFORMS;

OPTICAL METROLOGY; PHASE RETRIEVAL;

IMAGE RETRIEVAL;

EID: 0035759923     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.437189     Document Type: Article

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