Three-dimensional pattern recognition using fringe projection

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4435, Issue , 2001, Pages 31-41

  Ferreira, Carlos ^a   Esteve Taboada, José J ^a   García, Javier ^a  

^a UNIVERSITY OF VALENCIA   (Spain)

Author keywords

Fourier transform profilometry; Optical correlators; Rotation invariance; Scale invariance; Three dimensional object recognition

Indexed keywords

DIFFRACTION GRATINGS; FOURIER TRANSFORMS; OPTICAL CORRELATION; PROFILOMETRY;

FOURIER TRANSFORM PROFILOMETRY;

OBJECT RECOGNITION;

EID: 0035759848     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.451156     Document Type: Conference Paper

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