Optical characterization of edge emitting LEDs (EELEDs) for scanning display applications

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4445, Issue , 2001, Pages 111-118

  Altendorf, Eric ^a   Gong, Timothy ^a   Brown, Margaret ^a   Nissen, James ^b  

^a MICROVISION INC   (United States)

^b OREGON INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Edge emitting LEDs (EELEDs); InGaN LEDs; Scanned displays

Indexed keywords

DIFFRACTION; DISPLAY DEVICES; IMAGING TECHNIQUES; SCANNING; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR LASERS;

COLOR SCANNED DISPLAYS;

LIGHT EMITTING DIODES;

EID: 0035759552     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.450034     Document Type: Article

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