a-Si 160×120 microIR camera: Operational performance

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4393, Issue , 2001, Pages 89-98

  Ropson, S ^a   Brady, J ^a   Francisco, G ^a   Gilstrap, J ^a   Gooch, R ^a   McCardel, W ^a   Ritchey, B ^a   Schimert, T ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; BOLOMETERS; INFRARED IMAGING; TEMPERATURE;

INFRARED SENSORS; MICROBOLOMETERS;

CAMERAS;

EID: 0035758937     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.441258     Document Type: Conference Paper

References (0)