Electronic speckle pattern interferometry based on spatial fringe analysis method

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4398, Issue , 2001, Pages 14-22

  Arai, Yasuhiko ^a   Yokozeki, Shunsuke ^a  

^a KANSAI UNIVERSITY   (Japan)

Author keywords

Digital Filter; ESPI; Fourier Transformation; Spatial Fringe Analysis; Speckle size

Indexed keywords

CHARGE COUPLED DEVICES; COMPUTER SIMULATION; DIGITAL FILTERS; FOURIER TRANSFORMS; INTERFEROMETRY;

SPATIAL FRINGE ANALYSIS;

SPECKLE;

EID: 0035758296     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.445547     Document Type: Conference Paper

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