Determination of material properties of thin layers using angle beam ultrasonic spectroscopy

Proceedings of the IEEE Ultrasonics Symposium

Volumn 1, Issue , 2001, Pages 701-704

  Adler, Laszlo ^a   Rokhlin, Stanislav ^b   Baltazar, Arturo ^a,b  

^a Adler Consultants   (United States)

^b OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC PROPERTIES; ACOUSTIC SIGNAL PROCESSING; ADHESIVE JOINTS; ALGORITHMS; DENSITY MEASUREMENT (SPECIFIC GRAVITY); ELASTIC MODULI; ELECTROMAGNETIC WAVE ATTENUATION; SPECTROSCOPIC ANALYSIS; THICKNESS MEASUREMENT;

ANGLE BEAM ULTRASONIC SPECTROSCOPY; ULTRASONIC SCANNER;

ULTRASONICS;

EID: 0035732304     PISSN: 10510117     EISSN: None     Source Type: Journal    
DOI: 10.1109/ULTSYM.2001.991822     Document Type: Article

References (4)

1. Ultrasonic scattering from imperfect interface: Quasi-static model
2. Models for ultrasonic characterization of environmental degradation of interfaces in adhesive joints
3. Determination of elastic moduli, density attenuation and thickness of a layer using ultrasonic spectroscopy at two angels