A distribution-free lower bound for availability of quantile-based inspection schemes

IEEE Transactions on Reliability

Volumn 50, Issue 4, 2001, Pages 419-421

  Yang, Yoonjung ^a   Klutke, Georgia Ann ^b  

^a SAMSUNG Electronics   (South Korea)

^b Texas AandM University   (United States)

Author keywords

Inspection policy; Inspection rate; Limiting average availability; Quantile based inspection

Indexed keywords

AVAILABILITY; BOUNDARY CONDITIONS; FAILURE ANALYSIS; WEIBULL DISTRIBUTION;

DISTRIBUTION-FREE LOWER BOUND; INSPECTION POLICY; INSPECTION RATE; QUANTILE-BASED INSPECTION SCHEMES;

INSPECTION;

EID: 0035722575     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.983406     Document Type: Article

References (5)

1. Improved inspection schemes for deteriorating equipment