Embedded non volatile memories

International Conference on ASIC, Proceedings

Volumn , Issue , 2001, Pages 210-215

  Shum, Danny ^a  

^a INFINEON TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; DESIGN FOR TESTABILITY; DIELECTRIC MATERIALS; FLASH MEMORY; LOGIC DESIGN; LOGIC GATES; MICROCONTROLLERS; MOS DEVICES; ROM;

CELL DESIGN; DESIGN IN TEST; EMBEDDED NON VOLATILE MEMORIES;

NONVOLATILE STORAGE;

EID: 0035719394     PISSN: None     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (29)