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Volumn , Issue , 2001, Pages 193-196
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Electrical degradation of InAlAs/InGaAs metamorphic high-electron mobility transistors
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
ELECTRIC CURRENTS;
ELECTRIC RESISTANCE;
IMPACT IONIZATION;
SEMICONDUCTING INDIUM COMPOUNDS;
THRESHOLD VOLTAGE;
TRANSCONDUCTANCE;
DRAIN CONTACT RESISTANCE;
ELECTRICAL DEGRADATION;
EXTRINSIC DRAIN;
METAMORPHIC HIGH ELECTRON MOBILITY TRANSISTORS;
SHEET-ELECTRON CONCENTRATION;
HIGH ELECTRON MOBILITY TRANSISTORS;
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EID: 0035717573
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (6)
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References (12)
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