Microcalorimeter/EBIT measurements of X-ray spectra of highly charged ions

Physica Scripta T

Volumn 92, Issue , 2001, Pages 454-456

  Kink, I ^a   Laming, J M ^b   Takacs E ^c   Porto, J V ^a   Gillaspy, J D ^a   Silver, E ^d   Schnopper, H ^d   Bandler, S R ^d   Barbera, M ^e   Brickhouse, N ^d   Murray, S ^d   Madden, N ^f   Landis, D ^f   Beeman, J ^f   Haller, E E ^f  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^d HARVARD SMITHSONIAN CENTER FOR ASTROPHYSICS   (United States)

^e INAF OSSERVATORIO ASTRONOMICO DI PALERMO   (Italy)

^f LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALORIMETERS; ELECTRON BEAMS; ELECTRON TRANSITIONS; ELECTRON TRAPS; RESONANCE; SPECTRUM ANALYSIS; X RAY ANALYSIS;

ELECTRON BEAM ION TRAPS (EBIT); HIGHLY CHARGED IONS (HCI);

IONS;

EID: 0035714848     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)