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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 12, 2001, Pages 6829-6834

Quantitative determination of mixed anisotropies in Fe(100) thin films and annealing-induced magnetic reorientation

(4) Calleja, Javier F a Menéndez, José L b Cebollada, Alfonso b Contreras, Carmen a

a UNIVERSITY OF OVIEDO (Spain)

b INSTITUTO DE MICROELECTRÓNICA DE MADRID (Spain)

Author keywords

Fe; FeN; Kerr effect; Magnetic anisotropies; Thin films; Transverse biased initial susceptibility

Indexed keywords

CRYSTAL LATTICES; EPITAXIAL GROWTH; IRON; KERR MAGNETOOPTICAL EFFECT; MAGNETIC SUSCEPTIBILITY; MAGNETIC THIN FILMS; MAGNETIC VARIABLES MEASUREMENT; NITRIDES; RAPID THERMAL ANNEALING; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SPUTTER DEPOSITION; X RAY DIFFRACTION ANALYSIS;

IRON NITRIDE; MAGNETIC REORIENTATION; MAGNETIC SUSCEPTIBILITY MEASUREMENT; TRANSVERSE BIASED INITIAL SUSCEPTIBILITY;

MAGNETIC ANISOTROPY;

EID: 0035712176 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.40.6829 Document Type: Article

Times cited : (7)

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