Dislocation multiplication during the very first stages of plastic deformation in silicon observed by X-ray topography

Materials Science and Engineering: A

Volumn 319-321, Issue , 2001, Pages 152-155

  Vallino, Frédéric ^a,b   Château, Jean Philippe ^a,b   Jacques, Alain ^a,b,c   George, Amand ^a,b  

^a INSTITUT JEAN LAMOUR   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c CNRS   (France)

Author keywords

Burgers vector; Dislocation segments; Shear stress; Slip band; X ray topography

Indexed keywords

CREEP; DISLOCATIONS (CRYSTALS); PLASTIC DEFORMATION; SILICON; STRESS ANALYSIS; SURFACE TOPOGRAPHY; THERMAL EFFECTS; X RAY ANALYSIS;

X-RAY TOPOGRAPHY;

SINGLE CRYSTALS;

DISLOCATION; PLASTIC DEFORMATION; SILICON; TOMOGRAPHY;

EID: 0035706875     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5093(01)01044-9     Document Type: Article

References (7)