Multiple attractor cellular automata for hierarchical diagnosis of VLSI circuits

Proceedings of the Asian Test Symposium

Volumn , Issue , 2001, Pages 385-390

  Sikdar, Biplab K ^a   Ganguly, Niloy ^b   Karmakar, Aniket ^a   Chowdhury, Subha Sankar ^a   Chaudhuri, P Pal ^a  

^a INDIAN INSTITUTE OF ENGINEERING SCIENCE AND TECHNOLOGY   (India)

^b IISWBM   (India)

Author keywords

Cellular automata; Fault diagnosis; Hierarchical diagnosis; MACA; Three class classifier

Indexed keywords

AUTOMATA THEORY; BUILT-IN SELF TEST; DATA STORAGE EQUIPMENT; FAILURE ANALYSIS; INTEGRATED CIRCUIT LAYOUT; MATRIX ALGEBRA; VLSI CIRCUITS;

CIRCUIT UNDER TEST; GALOIS EXTENSION FIELD; HIERARCHICAL DIAGNOSIS; MULTIPLE ATTRACTOR CELLULAR AUTOMATA;

INTEGRATED CIRCUIT TESTING;

EID: 0035704291     PISSN: 10817735     EISSN: None     Source Type: Journal    
DOI: 10.1109/ATS.2001.990314     Document Type: Article

References (7)

1. Fault dictionary compression and equivalence class computation for sequential circuits
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4. p) cellular automata as on-chip test pattern generator
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6. Phd thesis proposal - Cellular automata evolution: Theory and applications