Complex dielectric constant measurement techniques for high-speed signaling

IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Volumn , Issue , 2001, Pages 137-140

  Han, Dong Ho ^a   Li, Yuan Liang ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ELECTRONICS PACKAGING; MICROSTRIP LINES; WAVEGUIDES;

COPLANAR WAVEGUIDE STRUCTURES; HIGH-SPEED SIGNALING; VECTOR NETWORK ANALYZER;

PERMITTIVITY MEASUREMENT;

EID: 0035701580     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. Transmission/reflection and short-circuit line permittivity measurements
2. Calibrating on-wafer probes to the probe tips
3. Two methods for the measurements of substrate dielectric constant
4. Measurement of the intrinsic properties of materials by time-domain techniques
5. Automatic measurement of complex dielectric constant and permeability at microwave frequencies