Composite materials for planar frequency agile microwave devices

IEEE High Frequency Postgraduate Student Colloquium

Volumn , Issue , 2001, Pages 59-64

  Mills, John B ^a   Stevens, Christopher J ^a   Edwards, David J ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COMPOSITE MATERIALS; DIELECTRIC LOSSES; FERRITES; FERROELECTRIC DEVICES; GROWTH (MATERIALS); MAGNETIC FIELD EFFECTS; PERMITTIVITY; RESINS; STRUCTURE (COMPOSITION); SUBSTRATES;

FERRITE LOADED COMPOSITES; MICROWAVE PROPERTIES; PLANAR DEVICE FABRICATION; PLANAR FREQUENCY AGILE MICROWAVE DEVICES;

MICROWAVE DEVICES;

EID: 0035693340     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)

1. Thin-film ferroelectric microwave devices
2. Ferroelectric tuning of planar and bulk microwave devices
3. A K-band-frequency agile microstrip bandpass filter using a thin-film HTS/ferroelectric/dielectric multilayer configuration
4. c superconducting resonators incorporating barium strontium titanate as a tuning material
5. Microwave characterization of partially magnetized ferrites
6. A catalog of low power loss parameters and high power thresholds for partially magnetized ferrites
7. 7-x films on ferrimagnetic garnet substrates
8. Tunable YBCO resonators on YIG substrates
9. 7-x thin films on polycrystalline ferrite for magnetically tunable microwave components
10. Magnetically tunable TBCCO based microstrip ring resonators
11. Terahertz time-domain spectroscopy of films fabricated from SU-8
12. Thru-reflect-line: An improved technique for calibrating the dual six-port automatic network analyzer
13. Measurement of the intrinsic properties of materials by time domain techniques
14. Transmission/reflection and short-circuit line methods for measuring permittivity and permeability
15. Microwave measurement of dielectric properties of low-loss materials by the dielectric rod resonator method