Mapping hardness using automated depth sensing process

Surface Engineering

Volumn 17, Issue 6, 2001, Pages 447-449

  Roebuck, B ^a   Stewart, M ^a   Morrell, R ^a   Gee, M ^a   Plint, G ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; COST EFFECTIVENESS; HARDNESS TESTING; MICROHARDNESS; PROBES;

SCANNING INDENTATION MECHANICAL MICROPROBES (SIMM);

MATERIALS TESTING;

EID: 0035691824     PISSN: 02670844     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)