Aging avionics - What causes it and how to respond

IEEE Transactions on Components and Packaging Technologies

Volumn 24, Issue 4, 2001, Pages 739-740

  Shawlee II, Walter ^a   Humphrey, Dave ^b  

^a Sphere Research Corporation   (Canada)

^b HONEYWELL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; AIRCRAFT PARTS AND EQUIPMENT; FAILURE ANALYSIS; MATHEMATICAL MODELS; RELIABILITY; SAFETY FACTOR; STATISTICAL METHODS; WEAR OF MATERIALS;

SAFETY ANALYSIS;

AVIONICS;

EID: 0035691808     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/6144.974969     Document Type: Article

References (6)

1. A tutorial: PRISM
2. Review of electronic system and device field failure returns
3. How failure prediction methodology affects electronic equipment design