Detecting delay faults using power supply transient signal analysis

IEEE International Test Conference (TC)

Volumn , Issue , 2001, Pages 395-404

  Singh, Abhishek ^a   Patel, Chintan ^a   Liao, Shirong ^a   Plusquellic, Jim ^a   Gattiker, Anne ^a  

^a UNIVERSITY OF MARYLAND BALTIMORE COUNTY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DELAY CIRCUITS; FREQUENCY DOMAIN ANALYSIS; POWER SUPPLY CIRCUITS; TIME DOMAIN ANALYSIS; WAVEFORM ANALYSIS;

TRANSIENT SIGNAL ANALYSIS (TSA);

INTEGRATED CIRCUIT TESTING;

EID: 0035687310     PISSN: 10893539     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEST.2001.966656     Document Type: Article

References (16)

1. Defect detection using power supply transient signal analysis
2. Predicting device performance from pass/fail transient signal analysis data
3. Defect-based test: A key enabler for successful migration to structural test
4. Power supply current signature (PSCS) analysis: A new approach to system testing
5. DD pulse response testing of analog and digital CMOS circuits
6. Transient power supply current testing of digital CMOS circuits
7. Monitoring power dissipation for fault detection
8. Defect detection with transient current testing and its potential for deep-submicron CMOS ICs
9. Process-tolerant test with energy consumption ratio
10. An analysis of delay defect detection capability of ECR test method
11. Analogue fault identification based on power supply current spectrum
12. DDT for application to VLSI device testing