Characteristic impedance extraction using calibration comparison

IEEE Transactions on Microwave Theory and Techniques

Volumn 49, Issue 12, 2001, Pages 2573-2579

  Vandenberghe, Servaas ^b   Schreurs, Dominique M M P ^a,b   Carchon, Geert ^a,c   Nauwelaers, Bart K J C ^a,b   De Raedt, Walter ^c  

^a IEEE

^b UNIVERSITY OF LEUVEN   (Belgium)

^c IMEC   (Belgium)

Author keywords

Coplanar waveguides; Impedance measurement

Indexed keywords

THRU-LINE-REFLECT (TLR) STANDARDS;

ELECTRIC CONDUCTIVITY; ELECTRIC IMPEDANCE MEASUREMENT; PROBES; SILICON WAFERS; SUBSTRATES;

WAVEGUIDES;

EID: 0035687081     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.971652     Document Type: Conference Paper

References (10)

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