AC-Scan: Microprocessors are ready but where is the infrastructure?

IEEE International Test Conference (TC)

Volumn , Issue , 2001, Pages 1170-

  Raina, Rajesh ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMPUTER AIDED SOFTWARE ENGINEERING; DEFECTS; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE TESTING;

AUTOMATIC TEST PATTERN GENERATION;

MICROPROCESSOR CHIPS;

EID: 0035684301     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)