Optimal production test times through adaptive test programming

IEEE International Test Conference (TC)

Volumn , Issue , 2001, Pages 908-915

  Benner, Scott ^a   Boroffice, Oluseyi ^a  

^a QUALCOMM INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; DATA STORAGE EQUIPMENT; GAIN CONTROL; INTEGRATED CIRCUIT MANUFACTURE; STATISTICAL METHODS;

ADAPTIVE TEST PROGRAMMING TECHNIQUES; AUTOMATIC TEST EQUIPMENTS (ATE);

INTEGRATED CIRCUIT TESTING;

EID: 0035681261     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)