A new test/diagnosis/rework model for use in technical cost modeling of electronic systems assembly

IEEE International Test Conference (TC)

Volumn , Issue , 2001, Pages 1108-1117

  Trichy, Thiagarajan ^a   Sandborn, Peter ^a   Raghavan, Ravi ^a   Sahasrabudhe, Shubhada ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; MONTE CARLO METHODS; PRINTED CIRCUIT BOARDS; PROBABILITY DISTRIBUTIONS;

ELECTRONIC ASSEMBLIES;

ELECTRONIC EQUIPMENT TESTING;

EID: 0035680778     PISSN: 10893539     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEST.2001.966737     Document Type: Article

References (15)

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11. Sensitivity analysis in economic based test strategy planning
12. On the use of yielded cost in modeling electronic assembly processes
13. Rapid reliability optimization of competing power module topologies using semi-analytical fatigue models