Correlation of mosaic-structure peculiarities with electric characteristics and surface multifractal parameters for GaN epitaxial layers

Nanotechnology

Volumn 12, Issue 4, 2001, Pages 471-474

  Shmidt, N M ^a   Emtsev, V V ^a   Kolmakov, A G ^a,b   Kryzhanovsky, A D ^a   Lundin, W V ^a   Poloskin, D S ^a   Ratnikov, V V ^a   Titkov, A N ^a   Usikov, A S ^a   Zavarin, E E ^a  

^a IOFFE INSTITUTE   (Russian Federation)

^b BAIKOV INSTITUTE OF METALLURGY AND MATERIALS SCIENCE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; FRACTALS; GALLIUM NITRIDE; MULTILAYERS; SUBSTRATES;

EPITAXIAL LAYERS;

SURFACE STRUCTURE;

EID: 0035673541     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/12/4/318     Document Type: Conference Paper

References (7)