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Volumn 308-310, Issue , 2001, Pages 506-509
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Mechanisms of capture- and recombination-enhanced defect reactions in semiconductors
a
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Author keywords
Coherent capture; Defect reaction; Instability; Phonon kick
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Indexed keywords
ACTIVATION ANALYSIS;
CHARGE CARRIERS;
CRYSTAL DEFECTS;
CRYSTAL LATTICES;
ENERGY GAP;
LATTICE VIBRATIONS;
PHONONS;
RATE CONSTANTS;
PHONON KICK;
SEMICONDUCTOR MATERIALS;
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EID: 0035670940
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4526(01)00724-4 Document Type: Article |
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Times cited : (6)
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References (16)
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