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Volumn 308-310, Issue , 2001, Pages 792-795

Study of vacancy-type defects after Cu diffusion in GaAs

Author keywords

Cu diffusion; GaAs; Positron annihilation; TEM; Vacancy clusters

Indexed keywords

ANNEALING; COPPER; CRYSTAL DEFECTS; DIFFUSION; POSITRONS; QUENCHING; TRANSMISSION ELECTRON MICROSCOPY; VAPOR PRESSURE;

EID: 0035669111     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(01)00805-5     Document Type: Article
Times cited : (6)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.