Multiple-frequency distorted-wave Born approach to 2D inverse profiling

Inverse Problems

Volumn 17, Issue 6, 2001, Pages 1635-1644

  Tijhuis, Anton G ^a   Belkebir, Kamal ^b   Litman, Amélie C S ^c   De Hon, Bastiaan P ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b AIX MARSEILLE UNIVERSITÉ   (France)

^c SCHLUMBERGER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035661918     PISSN: 02665611     EISSN: None     Source Type: Journal    
DOI: 10.1088/0266-5611/17/6/307     Document Type: Article

References (14)