A new spectrophotometer system for measuring thermal radiation phenomena in a 0.30-11 μm wavelength region

Measurement Science and Technology

Volumn 12, Issue 12, 2001, Pages 2113-2120

  Wakabayashi, H ^a   Makino, T ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

Heat transfer; Interference and diffraction; Real surface; Spectroscopic measurement; Surface diagnosis; Surface film; Surface roughness; Thermal radiation; Thermophysical property

Indexed keywords

DIFFRACTION; HEAT RADIATION; HIGH TEMPERATURE OPERATIONS; MICROSTRUCTURE; OXIDATION; SURFACE STRUCTURE; THERMAL VARIABLES MEASUREMENT;

AIR OXIDATION;

SPECTROPHOTOMETERS;

HEAT RADIATION; HEAT TRANSFER; SPECTROMETRY; SURFACE ROUGHNESS;

EID: 0035655601     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/12/12/312     Document Type: Article

References (12)

1. Thermal radiation characteristics of real surfaces of solid materials in natural/industrial environments
2. Total normal emittance of stainless steels at high temperatures: Influence of oxide layer growth
3. Behavior of spectral emissivity with oxidation of metals
4. Transition behaviors in thermal radiation characteristics of heat-resisting metals and alloys in oxidation process
5. System for measuring spectral distribution of normal emissivities of materials in direct current heating
6. A method for multi-wavelength radiation prometry measuring emission and reflection simultaneously and remotely
7. Numerical simulation on transient behavior of reflection characteristics of real surfaces of metallic materials
8. Study of the radiative properties of heat resisting metals and alloys (1st report, optical constants and emissivities of nickel, cobalt and chromium)
9. Development of high-speed radiation spectroscopy with an application to a diagnosis technique for temperature and microgeometry of a metal surface