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Volumn 14, Issue 3, 2001, Pages 251-258
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Thermal stress measurement of quartz oscillator module packaging
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Author keywords
Digital image correlation method (DICM); Micro zone strain measurement; Quartz oscillator module packaging; Thermal stress
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Indexed keywords
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EID: 0035649956
PISSN: 08949166
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (4)
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References (9)
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