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Volumn 14, Issue 3, 2001, Pages 251-258

Thermal stress measurement of quartz oscillator module packaging

Author keywords

Digital image correlation method (DICM); Micro zone strain measurement; Quartz oscillator module packaging; Thermal stress

Indexed keywords


EID: 0035649956     PISSN: 08949166     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (4)

References (9)
  • 2
    • 0020130132 scopus 로고
    • Digital imaging techniques in experimental stress analysis
    • Peters, W. H. and Ranson, W. F., Digital imaging techniques in experimental stress analysis, Opt. Eng., Vol. 21, No. 3, 1982, 427-432.
    • (1982) Opt. Eng. , vol.21 , Issue.3 , pp. 427-432
    • Peters, W.H.1    Ranson, W.F.2
  • 9
    • 0003709624 scopus 로고
    • Prentice-Hall, Inc., Englewood Cliffs, New Jersey
    • Fung, Y. C., Foundations of Solid Mechanics, Prentice-Hall, Inc., Englewood Cliffs, New Jersey, 1965.
    • (1965) Foundations of Solid Mechanics
    • Fung, Y.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.